Dielectric measurements for low-loss materials using transmission phase-shift method
This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band r...
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主要な著者: | Kok, Yeow You, Lee, Y. S., Zahid, L., Malek, M. F. A., Lee, Kim Yee, Cheng, Ee Meng, Khamis, Nor Hisham |
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フォーマット: | 論文 |
言語: | English |
出版事項: |
Penerbit UTM Press
2015
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主題: | |
オンライン・アクセス: | http://eprints.utm.my/id/eprint/58306/1/KYYou2015_DielectricMeasurementsforLowLoss.pdf http://eprints.utm.my/id/eprint/58306/ http://www.dx.doi.org/10.11113/jt.v77.6286 |
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