Dielectric measurements for low-loss materials using transmission phase-shift method
This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band r...
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Online Access: | http://eprints.utm.my/id/eprint/58306/1/KYYou2015_DielectricMeasurementsforLowLoss.pdf http://eprints.utm.my/id/eprint/58306/ http://www.dx.doi.org/10.11113/jt.v77.6286 |
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my.utm.583062021-08-16T14:44:51Z http://eprints.utm.my/id/eprint/58306/ Dielectric measurements for low-loss materials using transmission phase-shift method Kok, Yeow You Lee, Y. S. Zahid, L. Malek, M. F. A. Lee, Kim Yee Cheng, Ee Meng Khamis, Nor Hisham TK Electrical engineering. Electronics Nuclear engineering This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band rectangular waveguides. Penerbit UTM Press 2015 Article PeerReviewed application/pdf en http://eprints.utm.my/id/eprint/58306/1/KYYou2015_DielectricMeasurementsforLowLoss.pdf Kok, Yeow You and Lee, Y. S. and Zahid, L. and Malek, M. F. A. and Lee, Kim Yee and Cheng, Ee Meng and Khamis, Nor Hisham (2015) Dielectric measurements for low-loss materials using transmission phase-shift method. Jurl Teknologi, 77 (10). pp. 69-77. ISSN 1279-696 http://www.dx.doi.org/10.11113/jt.v77.6286 DOI: 10.11113/jt.v77.6286 |
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TK Electrical engineering. Electronics Nuclear engineering Kok, Yeow You Lee, Y. S. Zahid, L. Malek, M. F. A. Lee, Kim Yee Cheng, Ee Meng Khamis, Nor Hisham Dielectric measurements for low-loss materials using transmission phase-shift method |
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This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band rectangular waveguides. |
format |
Article |
author |
Kok, Yeow You Lee, Y. S. Zahid, L. Malek, M. F. A. Lee, Kim Yee Cheng, Ee Meng Khamis, Nor Hisham |
author_facet |
Kok, Yeow You Lee, Y. S. Zahid, L. Malek, M. F. A. Lee, Kim Yee Cheng, Ee Meng Khamis, Nor Hisham |
author_sort |
Kok, Yeow You |
title |
Dielectric measurements for low-loss materials using transmission phase-shift method |
title_short |
Dielectric measurements for low-loss materials using transmission phase-shift method |
title_full |
Dielectric measurements for low-loss materials using transmission phase-shift method |
title_fullStr |
Dielectric measurements for low-loss materials using transmission phase-shift method |
title_full_unstemmed |
Dielectric measurements for low-loss materials using transmission phase-shift method |
title_sort |
dielectric measurements for low-loss materials using transmission phase-shift method |
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Penerbit UTM Press |
publishDate |
2015 |
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http://eprints.utm.my/id/eprint/58306/1/KYYou2015_DielectricMeasurementsforLowLoss.pdf http://eprints.utm.my/id/eprint/58306/ http://www.dx.doi.org/10.11113/jt.v77.6286 |
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1709667336618770432 |
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13.211869 |