Design for testability I: from full scan to partial scan
It is important to check whether the manufactured circuit has physical defects or not. Else, the defective part may adversely affect the circuit's functioning. The checking process is called testing or manufacturing test. In other words, manufacturing test is an important step in VLSI realizati...
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| Format: | Book Section |
| Language: | English |
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Penerbit UTM
2008
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| Online Access: | http://eprints.utm.my/id/eprint/31036/1/ChiaYeeOoi2008_DesignforTestabilityIFromFullScantoPartial.pdf http://eprints.utm.my/id/eprint/31036/ |
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