Generation of new low-complexity March algorithms for optimum faults detection in SRAM

Memory BIST implements March test techniques extensively for testing embedded memories on a chip. A high-complexity test algorithm like the March MSS (18N) can guarantee the detection of all unlinked static faults in SRAM. In contrast, March algorithms with lower complexity can be used to reduce tes...

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主要な著者: Jidin, Aiman Zakwan, Hussin, Razaidi, Lee, Weng Fook, Mispan, Mohd Syafiq, Zakaria, Nor Azura, Loh, Wan Ying, Zamin, Norshuhani
フォーマット: 論文
言語:English
出版事項: Institute Of Electrical And Electronics Engineers Inc. 2023
オンライン・アクセス:http://eprints.utem.edu.my/id/eprint/27493/2/0260402082023.PDF
http://eprints.utem.edu.my/id/eprint/27493/
https://ieeexplore.ieee.org/document/9984966
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