Integrated feed forward system for chemical mechanical polishing oxide removal process automation to improve productivity

Chemical Mechanical Planarization (CMP) is one of the main processes in semiconductor wafer fabrication. It is the only process that has contact physically with the wafer, where a pad is placed directly onto the wafer and polished in a circular motion at a particular speed to planarize the wafer sur...

詳細記述

保存先:
書誌詳細
第一著者: Ramlan, Samad
フォーマット: 学位論文
言語:English
English
出版事項: 2022
主題:
オンライン・アクセス:http://eprints.utem.edu.my/id/eprint/26945/1/Integrated%20feed%20forward%20system%20for%20chemical%20mechanical%20polishing%20oxide%20removal%20process%20automation%20to%20improve%20productivity.pdf
http://eprints.utem.edu.my/id/eprint/26945/2/Integrated%20feed%20forward%20system%20for%20chemical%20mechanical%20polishing%20oxide%20removal%20process%20automation%20to%20improve%20productivity.pdf
http://eprints.utem.edu.my/id/eprint/26945/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=122157
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