Accelerating Image Processing Of Wafer Inspection
Wafer inspection, where quality electronics integrated circuit is ensured to be manufactured, is playing an important role at the front line of E&E based manufacturing. The current line scan camera-based image processing software for wafer inspection, (edge detection, morphological operations, a...
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| المؤلفون الرئيسيون: | , , , |
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| التنسيق: | Technical Report |
| اللغة: | English |
| منشور في: |
UTeM
2020
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| الوصول للمادة أونلاين: | http://eprints.utem.edu.my/id/eprint/25460/1/Accelerating%20Image%20Processing%20Of%20Wafer%20Inspection.pdf http://eprints.utem.edu.my/id/eprint/25460/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=117974 |
| الوسوم: |
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