Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

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书目详细资料
主要作者: Karuppiah, K.Vasanthan
格式: Thesis
语言:English
English
出版: 2017
主题:
在线阅读:http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
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