Improving OEE data quality by automated data collection through identifying productivity potentials
Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...
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| Format: | Thesis |
| Language: | English English |
| Published: |
2017
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| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf http://eprints.utem.edu.my/id/eprint/20972/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936 |
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http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdfhttp://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936