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Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

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Main Author: Karuppiah, K.Vasanthan
Format: Thesis
Language:English
English
Published: 2017
Subjects:
T Technology (General)
TS Manufactures
Online Access:http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
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spelling my.utem.eprints.209722022-11-11T12:07:55Z http://eprints.utem.edu.my/id/eprint/20972/ Improving OEE data quality by automated data collection through identifying productivity potentials Karuppiah, K.Vasanthan T Technology (General) TS Manufactures Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE losses are basic to the improvement studies, however it is difficult to gather reliable and precise information. Hence, people will find the obscure contrasts between the manual recorded losses from their operational system and OEE losses from SEMI standard definition once people execute OEE. Besides, how to acquire the every stoppages of machine in real time to determine equipment stability issued to be conquered. This project is to develop an IT integrate framework to record the equipment process state for the bottleneck process "wire bonder" in the semiconductor assembly industry. Semiconductor equipment interface protocol for equipment to host communication (SECS/GEM) and Manufacturing Execution System (MES) into an Automated Data Collection framework for gathering valuable information. The information quality is further assurance by the real time detection of equipment status from the automate data collection framework. The application of the automate data collection framework is get rid of the unknown OEE losses. This will resolves the accuracy and timeliness issue associated with manual gathering OEE information. 2017 Thesis NonPeerReviewed text en http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf text en http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf Karuppiah, K.Vasanthan (2017) Improving OEE data quality by automated data collection through identifying productivity potentials. Masters thesis, Universiti Teknikal Malaysia Melaka. https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
English
topic T Technology (General)
TS Manufactures
spellingShingle T Technology (General)
TS Manufactures
Karuppiah, K.Vasanthan
Improving OEE data quality by automated data collection through identifying productivity potentials
description Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE losses are basic to the improvement studies, however it is difficult to gather reliable and precise information. Hence, people will find the obscure contrasts between the manual recorded losses from their operational system and OEE losses from SEMI standard definition once people execute OEE. Besides, how to acquire the every stoppages of machine in real time to determine equipment stability issued to be conquered. This project is to develop an IT integrate framework to record the equipment process state for the bottleneck process "wire bonder" in the semiconductor assembly industry. Semiconductor equipment interface protocol for equipment to host communication (SECS/GEM) and Manufacturing Execution System (MES) into an Automated Data Collection framework for gathering valuable information. The information quality is further assurance by the real time detection of equipment status from the automate data collection framework. The application of the automate data collection framework is get rid of the unknown OEE losses. This will resolves the accuracy and timeliness issue associated with manual gathering OEE information.
format Thesis
author Karuppiah, K.Vasanthan
author_facet Karuppiah, K.Vasanthan
author_sort Karuppiah, K.Vasanthan
title Improving OEE data quality by automated data collection through identifying productivity potentials
title_short Improving OEE data quality by automated data collection through identifying productivity potentials
title_full Improving OEE data quality by automated data collection through identifying productivity potentials
title_fullStr Improving OEE data quality by automated data collection through identifying productivity potentials
title_full_unstemmed Improving OEE data quality by automated data collection through identifying productivity potentials
title_sort improving oee data quality by automated data collection through identifying productivity potentials
publishDate 2017
url http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/
https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
_version_ 1751540443410071552
score 13.211869

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