Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) an...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2017
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf http://eprints.usm.my/46475/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|