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Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range

Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) an...

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Main Author: Cha, Hong Ye
Format: Thesis
Language:English
Published: 2017
Subjects:
T Technology
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf
http://eprints.usm.my/46475/
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spelling my.usm.eprints.46475 http://eprints.usm.my/46475/ Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range Cha, Hong Ye T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the prototype are measured by the proposed MTRL kits and compared with commercial SOLT kits, and validated by FE results. The comparison results between MTRL, SOLT and FE models for single layer SIW are discussed and analysed. MTRL calibration on single layer SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and closer insertion loss with respect to FE models. Moreover, a good agreement is achieved between the FE model and experimental results using MTRL calibration for double layer SIW with rectangular slot. A finite model of double layer SIW with rectangular slot shows four different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In contrast, the measurement obtained using MTRL calibration displays four different resonant frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and low insertion loss as compared with that of the SOLT method. 2017-08-01 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf Cha, Hong Ye (2017) Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range. Masters thesis, Universiti Sains Malaysia.
institution Universiti Sains Malaysia
building Hamzah Sendut Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Sains Malaysia
content_source USM Institutional Repository
url_provider http://eprints.usm.my/
language English
topic T Technology
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
spellingShingle T Technology
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Cha, Hong Ye
Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
description Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the prototype are measured by the proposed MTRL kits and compared with commercial SOLT kits, and validated by FE results. The comparison results between MTRL, SOLT and FE models for single layer SIW are discussed and analysed. MTRL calibration on single layer SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and closer insertion loss with respect to FE models. Moreover, a good agreement is achieved between the FE model and experimental results using MTRL calibration for double layer SIW with rectangular slot. A finite model of double layer SIW with rectangular slot shows four different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In contrast, the measurement obtained using MTRL calibration displays four different resonant frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and low insertion loss as compared with that of the SOLT method.
format Thesis
author Cha, Hong Ye
author_facet Cha, Hong Ye
author_sort Cha, Hong Ye
title Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_short Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_full Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_fullStr Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_full_unstemmed Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_sort thru-reflect-line (trl) calibration on multilayer substrate integrated waveguide (siw) for x-band frequency range
publishDate 2017
url http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf
http://eprints.usm.my/46475/
_version_ 1717094463385370624
score 13.211869

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