Investigating the structural transformation of individual Au-incorporated carbon nanofiber interconnect

Nowadays, a smaller electronic integrated circuit demands a smaller width and pitch of interconnect. Copper (Cu) interconnect, which is currently the most common, suffers from the size effect and grain boundary scattering. Hence, carbon materials such as carbon nanotubes (CNTs) and carbon nanofiber...

Full description

Saved in:
Bibliographic Details
Main Authors: Rosmi, Mohamad Saufi, Yaakob, Yazid, Mohd Yusop, Mohd Zamri, Md Isa, Illyas, Sidik, Siti Munirah, Abu Bakar, Suriani, Masaki, Tanemura
Format: Article
Published: Universiti Putra Malaysia 2022
Online Access:http://psasir.upm.edu.my/id/eprint/101980/
https://malaysianjournalofmicroscopy.org/ojs/index.php/mjm/article/view/621
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items