Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection

Industrial visual machine inspection system uses template or feature matching methods to locate or inspect parts or pattern on parts. These algorithms could not compensate for the change or variation on the inspected parts dynamically. Such problem was faced by a multinational semiconductor manuf...

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Bibliographic Details
Main Author: Sevamalai, Venantius Kumar
Format: Thesis
Language:English
English
Published: 1998
Subjects:
Online Access:http://psasir.upm.edu.my/id/eprint/10131/1/FK_1998_8_A.pdf
http://psasir.upm.edu.my/id/eprint/10131/
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