Space-Charge-Limited Dark Injection (SCL DI) transient measurements
It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection...
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| Main Authors: | , , , |
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| Format: | Conference Paper |
| Language: | en_US |
| Published: |
2017
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