Nanoindentation characterization of Sn-Ag-Sb/Cu substrate IMC Layer subject to thermal aging

Intermetallic compound (IMC) plays great roles in connecting components to PCB boards, as well as die attach materials connecting chips to substrates. Cracks in IMC may leads to failure in an electronic product function. Therefore it is important to investigate the mechanical properties of the IMC t...

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主要な著者: Shualdi, W., Bais, B., Ahmad, I., Omar, G., Isnin, A.
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出版事項: 2017
オンライン・アクセス:http://dspace.uniten.edu.my:8080/jspui/handle/123456789/5234
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