LFSR based hybrid pattern scheme achieving low power dissipation and high fault coverage
This paper presents a low hardware overhead scan- based test pattern generator (TPG) that can reduce switching activity in circuit under test (CUT) during test and also achieve very high fault coverage with reasonable lengths of test sequences. The proposed TPG is comprised of two TPGs: Seed selecte...
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| Format: | Conference paper |
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Institute of Electrical and Electronics Engineers Inc.
2023
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