Role of alternating current shape on microstructure and damage evolution of solder joints

Degradation; Mechanical properties; AC currents; Alternating current; Degradation of mechanical properties; Electronic package; Electronic systems; Micro-structural characterization; Solder joints; Thermal fluctuations; Electric impedance measurement

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Main Authors: Siswanto W.A., Krasnopevtsev A.Y., Talarpoushti G.F., Maseleno A., Kuzichkin O.R.
其他作者: 42862458800
格式: Article
出版: Elsevier Ltd 2023
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