Test chip and substrate design for flip chip microelectronic package thermal measurements
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Main Authors: | Goh, Teck Joo, Chiu, Chiapin, Seetharamu, Kankanhally N., Ghulam, Abdul Quadir, Prof. Dr., Zainal Alimuddin, Zainal Alauddin, Dr. |
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Other Authors: | teck.joo.goh@intel.com |
Format: | Article |
Language: | English |
Published: |
Emerald Group Publishing Limited
2014
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Subjects: | |
Online Access: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/33943 |
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