Study of Deposition Time Influence the Conical Structure during Electron Beam Induced Deposition (EBID)
Atomic force microscopy (AFM) is now a well-established technique for the surface characterization and imaging of a variety of materials. In AFM the accuracy of data is often limited by the tip geometry and the effect on this geometry of wear. One way to improve the tip geometry is by fabricate a sl...
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| Format: | Learning Object |
| Language: | English |
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Universiti Malaysia Perlis
2008
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| Online Access: | http://dspace.unimap.edu.my/xmlui/handle/123456789/2001 |
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