Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type
This paper represents the temperature effect on FinFET transistor and the possibility of using it as a temperature nano-sensor. The MuGFET simulation tool was used to investigate temperature characteristics of the FinFET. Current-voltage characteristics with different values of temperature were simu...
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Online Access: | http://umpir.ump.edu.my/id/eprint/19252/1/Hashim_2017_IOP_Conf._Ser.%253A_Mater._Sci._Eng._226_012123.pdf http://umpir.ump.edu.my/id/eprint/19252/ http://dx.doi.org/10.1088/1757-899X/226/1/012123 |
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my.ump.umpir.192522017-12-07T02:31:02Z http://umpir.ump.edu.my/id/eprint/19252/ Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type Hashim, Yasir TK Electrical engineering. Electronics Nuclear engineering This paper represents the temperature effect on FinFET transistor and the possibility of using it as a temperature nano-sensor. The MuGFET simulation tool was used to investigate temperature characteristics of the FinFET. Current-voltage characteristics with different values of temperature were simulated. MOS diode connection suggested using the FinFET transistor as a temperature nano-sensor. The final results shows that the best FinFET used as a nanosensor is with GaAs because it has the greatest ∆I (=10.9%) referring to ∆I at 25o C, and the best FinFET stable with increasing working temperature is Si-FinFET because it has the lowest ∆I (=6%) referring to ∆I at 25 C. IOP Publishing 2017 Conference or Workshop Item PeerReviewed application/pdf en cc_by http://umpir.ump.edu.my/id/eprint/19252/1/Hashim_2017_IOP_Conf._Ser.%253A_Mater._Sci._Eng._226_012123.pdf Hashim, Yasir (2017) Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type. In: IOP Conference Series: Materials Science and Engineering, International Research and Innovation Summit (IRIS2017), 6-7 May 2017 , Melaka, Malaysia. pp. 1-6., 226 (012123). ISSN 1757-899X http://dx.doi.org/10.1088/1757-899X/226/1/012123 10.1088/1757-899X/226/1/012123 |
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TK Electrical engineering. Electronics Nuclear engineering Hashim, Yasir Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
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This paper represents the temperature effect on FinFET transistor and the possibility of using it as a temperature nano-sensor. The MuGFET simulation tool was used to investigate temperature characteristics of the FinFET. Current-voltage characteristics with different values of temperature were simulated. MOS diode connection suggested using the FinFET transistor as a temperature nano-sensor. The final results shows that the best FinFET used as a nanosensor is with GaAs because it has the greatest ∆I (=10.9%) referring to ∆I at 25o C, and the best FinFET stable with increasing working temperature is Si-FinFET because it has the lowest ∆I (=6%) referring to ∆I at 25 C. |
format |
Conference or Workshop Item |
author |
Hashim, Yasir |
author_facet |
Hashim, Yasir |
author_sort |
Hashim, Yasir |
title |
Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
title_short |
Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
title_full |
Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
title_fullStr |
Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
title_full_unstemmed |
Investigation of FinFET as a Temperature Nano-Sensor Based on Channel Semiconductor Type |
title_sort |
investigation of finfet as a temperature nano-sensor based on channel semiconductor type |
publisher |
IOP Publishing |
publishDate |
2017 |
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http://umpir.ump.edu.my/id/eprint/19252/1/Hashim_2017_IOP_Conf._Ser.%253A_Mater._Sci._Eng._226_012123.pdf http://umpir.ump.edu.my/id/eprint/19252/ http://dx.doi.org/10.1088/1757-899X/226/1/012123 |
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