A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package
Due to the variation of temperature during service, the leads in quad flat packages (QFP) and plastic leaded chip carrier (PLCC) undergo high thermal stress, which can lead to large deformation and failure. Thus, the prediction of thermal stress and strain distributions is a prerequisite for reliabi...
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Institute of Electrical and Electronics Engineers
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my.um.eprints.258772021-04-21T02:26:46Z http://eprints.um.edu.my/25877/ A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package Zhou, Ding Haseeb, A.S. Md. Abdul Andriyana, Andri Wong, Yew Hoong Sabri, Mohd Faizul Mohd Low, B.Y. Pang, X.S. Eu, Poh Leng Tan, L.C. TJ Mechanical engineering and machinery Due to the variation of temperature during service, the leads in quad flat packages (QFP) and plastic leaded chip carrier (PLCC) undergo high thermal stress, which can lead to large deformation and failure. Thus, the prediction of thermal stress and strain distributions is a prerequisite for reliability analysis of such components. Along this line, this work analyzed the performances for gull wing and J-lead with different geometries. The thermal stress and strain distributions of both leads were determined by using the finite-element method (FEM). For each type of the lead, a parametric study was conducted in order to evaluate the effect of lead geometry on stress and strain distributions. Based on the simulation results, an optimum lead design was suggested. In addition, simulation work of package under thermal cyclic loading has been done, accumulated creep strain was found in the critical location of solder in package, and lifetime was predicted. © 2011-2012 IEEE. Institute of Electrical and Electronics Engineers 2021 Article PeerReviewed text en http://eprints.um.edu.my/25877/1/25877.pdf Zhou, Ding and Haseeb, A.S. Md. Abdul and Andriyana, Andri and Wong, Yew Hoong and Sabri, Mohd Faizul Mohd and Low, B.Y. and Pang, X.S. and Eu, Poh Leng and Tan, L.C. (2021) A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package. IEEE Transactions on Components, Packaging and Manufacturing Technology, 11 (3). pp. 435-443. ISSN 2156-3950 https://doi.org/10.1109/TCPMT.2020.3046750 doi:10.1109/TCPMT.2020.3046750 |
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TJ Mechanical engineering and machinery Zhou, Ding Haseeb, A.S. Md. Abdul Andriyana, Andri Wong, Yew Hoong Sabri, Mohd Faizul Mohd Low, B.Y. Pang, X.S. Eu, Poh Leng Tan, L.C. A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
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Due to the variation of temperature during service, the leads in quad flat packages (QFP) and plastic leaded chip carrier (PLCC) undergo high thermal stress, which can lead to large deformation and failure. Thus, the prediction of thermal stress and strain distributions is a prerequisite for reliability analysis of such components. Along this line, this work analyzed the performances for gull wing and J-lead with different geometries. The thermal stress and strain distributions of both leads were determined by using the finite-element method (FEM). For each type of the lead, a parametric study was conducted in order to evaluate the effect of lead geometry on stress and strain distributions. Based on the simulation results, an optimum lead design was suggested. In addition, simulation work of package under thermal cyclic loading has been done, accumulated creep strain was found in the critical location of solder in package, and lifetime was predicted. © 2011-2012 IEEE. |
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Article |
author |
Zhou, Ding Haseeb, A.S. Md. Abdul Andriyana, Andri Wong, Yew Hoong Sabri, Mohd Faizul Mohd Low, B.Y. Pang, X.S. Eu, Poh Leng Tan, L.C. |
author_facet |
Zhou, Ding Haseeb, A.S. Md. Abdul Andriyana, Andri Wong, Yew Hoong Sabri, Mohd Faizul Mohd Low, B.Y. Pang, X.S. Eu, Poh Leng Tan, L.C. |
author_sort |
Zhou, Ding |
title |
A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
title_short |
A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
title_full |
A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
title_fullStr |
A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
title_full_unstemmed |
A parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
title_sort |
parametric study of thermal stress and analysis of creep strain under thermal cyclic loading in a hybrid quad flat package |
publisher |
Institute of Electrical and Electronics Engineers |
publishDate |
2021 |
url |
http://eprints.um.edu.my/25877/1/25877.pdf http://eprints.um.edu.my/25877/ https://doi.org/10.1109/TCPMT.2020.3046750 |
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13.211869 |