Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films
Purpose: This paper aims to determine the crystallite size and microstrain values of AgSiN thin films using potential approach called approximation method. This method can be used as a replacement for other determination methods such as Williamson-Hall (W-H) plot and Warren-Averbach analysis. Design...
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| Main Authors: | , , , |
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| Format: | Article |
| Published: |
Emerald
2019
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| Subjects: | |
| Online Access: | http://eprints.um.edu.my/24010/ https://doi.org/10.1108/PRT-03-2018-0026 |
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