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Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan

This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a m...

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Main Author: Abu Hassan, Hasliza
Format: Thesis
Language:English
Published: 2010
Subjects:
Computer engineering. Computer hardware
Online Access:https://ir.uitm.edu.my/id/eprint/99265/1/99265.pdf
https://ir.uitm.edu.my/id/eprint/99265/
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spelling my.uitm.ir.992652024-12-17T04:35:18Z https://ir.uitm.edu.my/id/eprint/99265/ Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan Abu Hassan, Hasliza Computer engineering. Computer hardware This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a measurement system analysis technique to assure a stable gage measurement that ensures consistent measurements during repeated tests under similar characteristics, conditions or parameters. The external pre-tester boards were used to test BPMU and DPS boards on three J750 Automated Test Equipments (J750 ATE). The external pre-tester boards were analyzed for improvement in three areas: their usage as an acceptance tool during manufacturing, reduction in testing time, and their ability to predict and foretell future bugs. The analysis have proven the application of the pre-tester boards as an acceptance tool and prediction of future bugs (with their ability to detect faulty channels based on GR&R test results), and 85% time reduction in detection of faulty channels. Time reduction improves productivity, and thus it can be said the external pre-tester boards have the potential to be adopted in high-volume electronics manufacturing. 2010 Thesis NonPeerReviewed text en https://ir.uitm.edu.my/id/eprint/99265/1/99265.pdf Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan. (2010) Masters thesis, thesis, Universiti Teknologi MARA (UiTM). <http://terminalib.uitm.edu.my/99265.pdf>
institution Universiti Teknologi Mara
building Tun Abdul Razak Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Mara
content_source UiTM Institutional Repository
url_provider http://ir.uitm.edu.my/
language English
topic Computer engineering. Computer hardware
spellingShingle Computer engineering. Computer hardware
Abu Hassan, Hasliza
Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
description This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a measurement system analysis technique to assure a stable gage measurement that ensures consistent measurements during repeated tests under similar characteristics, conditions or parameters. The external pre-tester boards were used to test BPMU and DPS boards on three J750 Automated Test Equipments (J750 ATE). The external pre-tester boards were analyzed for improvement in three areas: their usage as an acceptance tool during manufacturing, reduction in testing time, and their ability to predict and foretell future bugs. The analysis have proven the application of the pre-tester boards as an acceptance tool and prediction of future bugs (with their ability to detect faulty channels based on GR&R test results), and 85% time reduction in detection of faulty channels. Time reduction improves productivity, and thus it can be said the external pre-tester boards have the potential to be adopted in high-volume electronics manufacturing.
format Thesis
author Abu Hassan, Hasliza
author_facet Abu Hassan, Hasliza
author_sort Abu Hassan, Hasliza
title Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
title_short Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
title_full Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
title_fullStr Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
title_full_unstemmed Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
title_sort design and analysis of external pre tester boards using op-amps for fast bpmu and dps testing / hasliza abu hassan
publishDate 2010
url https://ir.uitm.edu.my/id/eprint/99265/1/99265.pdf
https://ir.uitm.edu.my/id/eprint/99265/
_version_ 1818838315221123072
score 13.223943

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