Design and analysis of external pre tester boards using Op-Amps for fast BPMU and DPS testing / Hasliza Abu Hassan
This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a m...
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| フォーマット: | 学位論文 |
| 言語: | English |
| 出版事項: |
2010
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| オンライン･アクセス: | https://ir.uitm.edu.my/id/eprint/99265/1/99265.pdf https://ir.uitm.edu.my/id/eprint/99265/ |
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| 要約: | This research presents the hardware and software development, and analysis of three external pre-tester boards (ICC, ISINK and ISOURCE) for Gage Repeatability & Reproducibility (GR&R) current analysis of Board per Measurement Unit (BPMU) and Digital Power Supply (DPS) boards. GR&R is a measurement system analysis technique to assure a stable gage measurement that ensures consistent measurements during repeated tests under similar characteristics, conditions or parameters. The external pre-tester boards were used to test BPMU and DPS boards on three J750 Automated Test Equipments (J750 ATE). The external pre-tester boards were analyzed for improvement in three areas: their usage as an acceptance tool during manufacturing, reduction in testing time, and their ability to predict and foretell future bugs. The analysis have proven the application of the pre-tester boards as an acceptance tool and prediction of future bugs (with their ability to detect faulty channels based on GR&R test results), and 85% time reduction in detection of faulty channels. Time reduction improves productivity, and thus it can be said the external pre-tester boards have the potential to be adopted in high-volume electronics manufacturing. |
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