صورة الغلاف

Ellipsometry simulation by using Liberty Basic / Lunding Bakri

This study about developing a computer simulation on ellipsometry. Experiment on ellipsometry only gives data but the data cannot gives us better understanding on what happened on the wave in the medium. So, by this simulation it provides us better understanding and helped us to analyze the behavior...

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محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Bakri, Lunding
التنسيق: Student Project
اللغة:English
منشور في: 2008
الموضوعات:
Computer simulation
الوصول للمادة أونلاين:http://ir.uitm.edu.my/id/eprint/48743/1/48743.pdf
http://ir.uitm.edu.my/id/eprint/48743/
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id my.uitm.ir.48743
record_format eprints
spelling my.uitm.ir.487432021-07-23T08:04:19Z http://ir.uitm.edu.my/id/eprint/48743/ Ellipsometry simulation by using Liberty Basic / Lunding Bakri Bakri, Lunding Computer simulation This study about developing a computer simulation on ellipsometry. Experiment on ellipsometry only gives data but the data cannot gives us better understanding on what happened on the wave in the medium. So, by this simulation it provides us better understanding and helped us to analyze the behavior on incident wave, reflection wave and transmitted wave. These simulations also visualize to us the resultant wave on ellipsometry experiment. For this stdudy I used the Liberty Basic programming to simulate the wave component and resultant in ellipsmetry experiment. For this project there are 2 main cases and every main cases has 2 sub cases. The two sub case of first main case is (la) wave incident from a medium with n = 1 striking the surface of a dielectric with n = 2. Second sub case is(lb) wave incident on bare absorbing surface which is nl = 1 and n2 = 2-.2i.The second main case is reflection and transmission wave from a Film-Covered Surface. The first sub case is (2a) films whose thickness is 3/4 of the wavelength of light in the film. This thickness is chosen to simplify the algebra: the cosines make the diagonal matrix elements zero, and the sinus in the off-diagonal elements is replaced by. -1. The first example considers a film of index 2 on a substrate of index 1.5. While the second case is the substrate is absorbing. The second sub case (2b) example considers a film of index 1.6 on a substrate of index 2 - .2i. 2008 Student Project NonPeerReviewed text en http://ir.uitm.edu.my/id/eprint/48743/1/48743.pdf ID48743 Bakri, Lunding (2008) Ellipsometry simulation by using Liberty Basic / Lunding Bakri. [Student Project] (Unpublished)
institution Universiti Teknologi Mara
building Tun Abdul Razak Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Mara
content_source UiTM Institutional Repository
url_provider http://ir.uitm.edu.my/
language English
topic Computer simulation
spellingShingle Computer simulation
Bakri, Lunding
Ellipsometry simulation by using Liberty Basic / Lunding Bakri
description This study about developing a computer simulation on ellipsometry. Experiment on ellipsometry only gives data but the data cannot gives us better understanding on what happened on the wave in the medium. So, by this simulation it provides us better understanding and helped us to analyze the behavior on incident wave, reflection wave and transmitted wave. These simulations also visualize to us the resultant wave on ellipsometry experiment. For this stdudy I used the Liberty Basic programming to simulate the wave component and resultant in ellipsmetry experiment. For this project there are 2 main cases and every main cases has 2 sub cases. The two sub case of first main case is (la) wave incident from a medium with n = 1 striking the surface of a dielectric with n = 2. Second sub case is(lb) wave incident on bare absorbing surface which is nl = 1 and n2 = 2-.2i.The second main case is reflection and transmission wave from a Film-Covered Surface. The first sub case is (2a) films whose thickness is 3/4 of the wavelength of light in the film. This thickness is chosen to simplify the algebra: the cosines make the diagonal matrix elements zero, and the sinus in the off-diagonal elements is replaced by. -1. The first example considers a film of index 2 on a substrate of index 1.5. While the second case is the substrate is absorbing. The second sub case (2b) example considers a film of index 1.6 on a substrate of index 2 - .2i.
format Student Project
author Bakri, Lunding
author_facet Bakri, Lunding
author_sort Bakri, Lunding
title Ellipsometry simulation by using Liberty Basic / Lunding Bakri
title_short Ellipsometry simulation by using Liberty Basic / Lunding Bakri
title_full Ellipsometry simulation by using Liberty Basic / Lunding Bakri
title_fullStr Ellipsometry simulation by using Liberty Basic / Lunding Bakri
title_full_unstemmed Ellipsometry simulation by using Liberty Basic / Lunding Bakri
title_sort ellipsometry simulation by using liberty basic / lunding bakri
publishDate 2008
url http://ir.uitm.edu.my/id/eprint/48743/1/48743.pdf
http://ir.uitm.edu.my/id/eprint/48743/
_version_ 1706960434461933568
score 13.250246

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