Ellipsometry simulation by using Liberty Basic / Lunding Bakri
This study about developing a computer simulation on ellipsometry. Experiment on ellipsometry only gives data but the data cannot gives us better understanding on what happened on the wave in the medium. So, by this simulation it provides us better understanding and helped us to analyze the behavior...
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| フォーマット: | Student Project |
| 言語: | English |
| 出版事項: |
2008
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| オンライン･アクセス: | http://ir.uitm.edu.my/id/eprint/48743/1/48743.pdf http://ir.uitm.edu.my/id/eprint/48743/ |
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| 要約: | This study about developing a computer simulation on ellipsometry. Experiment on ellipsometry only gives data but the data cannot gives us better understanding on what happened on the wave in the medium. So, by this simulation it provides us better understanding and helped us to analyze the behavior on incident wave, reflection wave and transmitted wave. These simulations also visualize to us the resultant wave on ellipsometry experiment. For this stdudy I used the Liberty Basic programming to simulate the wave component and resultant in ellipsmetry experiment. For this project there are 2 main cases and every main cases has 2 sub cases. The two sub case of first main case is (la) wave incident from a medium with n = 1 striking the surface of a dielectric with n = 2. Second sub case is(lb) wave incident on bare absorbing surface which is nl = 1 and n2 = 2-.2i.The second main case is reflection and transmission wave from a Film-Covered Surface. The first sub case is (2a) films whose thickness is 3/4 of the wavelength of light in the film. This thickness is chosen to simplify the algebra: the cosines make the diagonal matrix elements zero, and the sinus in the off-diagonal elements is replaced by. -1. The first example considers a film of index 2 on a substrate of index 1.5. While the second case is the substrate is absorbing. The second sub case (2b) example considers a film of index 1.6 on a substrate of index 2 - .2i. |
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