The effects of P and N scaling on PN-junction characteristic / Ain Zubaidah Maslihan

The wet oxidation process is chosen to grow the oxide layer on the wafer surface. It is because the wet oxidation process has a significantly higher oxidation rate than the dry oxidation process. The n-type wafer was doped with the p-type material semiconductor, which is Boron. The Boron was doped o...

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Bibliographic Details
Main Author: Maslihan, Ain Zubaidah
Format: Student Project
Language:English
Published: 2010
Subjects:
Online Access:https://ir.uitm.edu.my/id/eprint/45052/1/45052.pdf
https://ir.uitm.edu.my/id/eprint/45052/
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