Correlation between defect density and current leakage in InAs∕GaAs quantum dot-in-well structures
We present a study of InAs/GaAs quantum dot-in-well �DWELL� material using transmission electron microscopy and leakage current-voltage measurements. The spacer layers between the DWELL layers have a variety of annealing and growth temperatures. We show that there is a strong correlation between spa...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Institute of Physics
2009
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/17647/1/Correlation_between_defect_density_and_current_leakage_-_Sanchez_JAP_2009.pdf http://irep.iium.edu.my/17647/ http://dx.doi.org/10.1063/1.3168492 |
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