Analysis of disturb coupling faults coverage by the March AZ2 algorithm in memory BIST
Memory BIST is a method implemented on chips to test memories by executing a sequence of test operations defined by the applied test algorithm. The March AZ2 test algorithm has been recently created to provide an excellent balance between the test fault coverage and test complexity to ensure fast an...
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Language: | en |
| Published: |
2024
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| Online Access: | http://eprints.utem.edu.my/id/eprint/29111/1/Analysis%20of%20Disturb%20Coupling%20Faults%20Coverage%20by%20the%20March%20AZ2%20algorithm%20in%20Memory%20BIST.pdf http://eprints.utem.edu.my/id/eprint/29111/ https://ieeexplore.ieee.org/document/10872732/ |
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