APA (7th ed.) Citation

Mispan, M. S., Kamaruddin, M. A., Jidin, A. Z., Mohd Nasir, H., & Mohd Nor, N. I. (2025). Low-cost integrated circuit packaging defect classification system using edge impulse and ESP32CAM. Institute Of Advanced Engineering And Science (IAES).

Chicago Style (17th ed.) Citation

Mispan, Mohd Syafiq, Muhammad Adni Kamaruddin, Aiman Zakwan Jidin, Haslinah Mohd Nasir, and Nurul Izza Mohd Nor. Low-cost Integrated Circuit Packaging Defect Classification System Using Edge Impulse and ESP32CAM. Institute Of Advanced Engineering And Science (IAES), 2025.

MLA (9th ed.) Citation

Mispan, Mohd Syafiq, et al. Low-cost Integrated Circuit Packaging Defect Classification System Using Edge Impulse and ESP32CAM. Institute Of Advanced Engineering And Science (IAES), 2025.