APA (7th ed.) Citation

Jidin, A. Z., Hussin, R., Mispan, M. S., & Lee, W. F. (2025). A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time. Institute Of Advanced Engineering And Science (IAES).

Chicago Style (17th ed.) Citation

Jidin, Aiman Zakwan, Razaidi Hussin, Mohd Syafiq Mispan, and Weng Fook Lee. A New 13N-complexity Memory Built-in Self-test Algorithm to Balance Static Random Access Memory Static Fault Coverage and Test Time. Institute Of Advanced Engineering And Science (IAES), 2025.

MLA (9th ed.) Citation

Jidin, Aiman Zakwan, et al. A New 13N-complexity Memory Built-in Self-test Algorithm to Balance Static Random Access Memory Static Fault Coverage and Test Time. Institute Of Advanced Engineering And Science (IAES), 2025.