Automatic generation of user-defined test algorithm description file for memory BIST implementation

Automatic generation of user-defined test algorithm description file for memory BIST implementation

Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking of the embedded memories on chips after the fabrication process. It can be used by implementing a standard testing algorithm available in the EDA tool library or a user-defined algorithm (UDA). This...

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Bibliographic Details
Main Authors: Hussin, Razaidi, Jidin, Aiman Zakwan, Loh, Wan Ying, Mispan, Mohd Syafiq, Lee, Weng Fook
Format: Article
Language:en
Published: Institute of Advanced Engineering and Science 2022
Online Access:http://eprints.utem.edu.my/id/eprint/26494/2/2022_AUTOMATIC%20GENERATION%20OF%20USER-DEFINED%20TEST%20ALGORITHM%20DESCRIPTION%20FILE%20FOR%20MEMORY%20BIST%20IMPLEMENTATION.PDF
http://eprints.utem.edu.my/id/eprint/26494/
https://ijres.iaescore.com/index.php/IJRES/article/view/20433/0
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http://eprints.utem.edu.my/id/eprint/26494/2/2022_AUTOMATIC%20GENERATION%20OF%20USER-DEFINED%20TEST%20ALGORITHM%20DESCRIPTION%20FILE%20FOR%20MEMORY%20BIST%20IMPLEMENTATION.PDF
http://eprints.utem.edu.my/id/eprint/26494/
https://ijres.iaescore.com/index.php/IJRES/article/view/20433/0

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