APA (7th ed.) Citation

Idris, M. I., Mohammed Napiah, Z. A. F., Zainudin, M. N. S., Mohd Chachuli, S. A., & Rashid, M. (2019). Characterization Of SiO2/SiC Interface Of Phosphorous-Doped MOS Capacitors By Conductance Measurements. Blue Eyes Intelligence Engineering and Sciences Publication.

Chicago Style (17th ed.) Citation

Idris, Muhammad Idzdihar, Zul Atfyi Fauzan Mohammed Napiah, Muhammad Noorazlan Shah Zainudin, Siti Amaniah Mohd Chachuli, and Marzaini Rashid. Characterization Of SiO2/SiC Interface Of Phosphorous-Doped MOS Capacitors By Conductance Measurements. Blue Eyes Intelligence Engineering and Sciences Publication, 2019.

MLA (9th ed.) Citation

Idris, Muhammad Idzdihar, et al. Characterization Of SiO2/SiC Interface Of Phosphorous-Doped MOS Capacitors By Conductance Measurements. Blue Eyes Intelligence Engineering and Sciences Publication, 2019.