Two stages fault detection method based on error, applied in EBM facility

Data driven technique is a well-known method in fault detection and it is suitable for large industrial systems. In this article, this technique is applied in an electron beam (EB) facility to assist the technology available in that facility so that the number and cost of equipment/component failure...

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Bibliographic Details

Main Authors:	Ghazali A.B., Hasan A.B.
Other Authors:	Faculty of Engineering and Built Environment
Format:	Conference Paper
Language:	English en_US
Published:	American Institute of Physics Inc. 2024
Subjects:	Adaptive neuro-fuzzy inference system (ANFIS) Boolean comparator with delay Data driven technique for fault detection Electron beam scanning High voltage power supply
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