Understanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layers
Transmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM were published in the 1950s. Since then the technique has been developed into...
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| Format: | Book |
| Language: | en |
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Penerbit Universiti Malaysia Perlis
2010
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| Subjects: | |
| Online Access: | http://dspace.unimap.edu.my/123456789/7897 |
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