Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification

Automated inspection machines for wafer defects usually captured thousands of images on a large scale to preserve the detail of defect features. However, most transfer learning architecture requires smaller images as input images. Thus, proper compression is required to preserve the defect features...

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Bibliographic Details

Main Authors:	Jessnor Arif, Mat Jizat, Ahmad Fakhri, Ab. Nasir, Anwar P. P., Abdul Majeed, Yuen, Edmund
Format:	Article
Language:	en
Published:	Penerbit UMP 2020
Subjects:	QA76 Computer software TJ Mechanical engineering and machinery
Online Access:	http://umpir.ump.edu.my/id/eprint/33607/1/Effect%20of%20image%20compression%20using%20fast%20fourier%20transformation.pdf http://umpir.ump.edu.my/id/eprint/33607/ https://doi.org/10.15282/mekatronika.v2i1.6704
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