Automated Classification and Removal of EEG Artifacts With SVM and Wavelet-ICA

Brain electrical activity recordings by electroencephalography (EEG) are often contaminated with signal artifacts. Procedures for automated removal of EEG artifacts are frequently sought for clinical diagnostics and brain-computer interface applications. In recent years, a combination of independent...

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Bibliographic Details

Main Authors:	Chong, Yeh Sai, Mokhtar, Norrima, Arof, Hamzah, Cumming, Paul, Iwahashi, Masahiro
Format:	Article
Published:	Institute of Electrical and Electronics Engineers 2018
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.um.edu.my/20815/ https://doi.org/10.1109/JBHI.2017.2723420
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