APA (7th ed.) Citation

Hatta, S., Soin, N., Abd Hadi, D., & Zhang, J. (2010). NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. Elsevier.

Chicago Style (17th ed.) Citation

Hatta, S.F.W.M, N. Soin, D. Abd Hadi, and J.F Zhang. NBTI Degradation Effect on Advanced-process 45 Nm High-k PMOSFETs with Geometric and Process Variations. Elsevier, 2010.

MLA (9th ed.) Citation

Hatta, S.F.W.M, et al. NBTI Degradation Effect on Advanced-process 45 Nm High-k PMOSFETs with Geometric and Process Variations. Elsevier, 2010.