NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]

Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16-nm High Performance (HP) Predictive Technology Model (PTM)....

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Bibliographic Details

Main Authors:	Zainudin, M. F., Hussin, H., Karim, J., Halim, A. K.
Format:	Article
Language:	en
Published:	UiTM Press 2018
Subjects:	Electric apparatus and materials. Electric circuits. Electric networks
Online Access:	https://ir.uitm.edu.my/id/eprint/63044/1/63044.pdf https://ir.uitm.edu.my/id/eprint/63044/ https://jeesr.uitm.edu.my/v1/
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