NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16-nm High Performance (HP) Predictive Technology Model (PTM)....
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | en |
| Published: |
UiTM Press
2018
|
| Subjects: | |
| Online Access: | https://ir.uitm.edu.my/id/eprint/63044/1/63044.pdf https://ir.uitm.edu.my/id/eprint/63044/ https://jeesr.uitm.edu.my/v1/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|