Hussin, H., Zoolfakar, A. S., & Ab Kadir, R. (2011). Investigation of stress effect technology on electrical characteristics of 90nm CMOS devices / Hanim Hussin, Ahmad Sabirin Zoolfakar and Rosmalini Ab Kadir.
Chicago Style (17th ed.) CitationHussin, Hanim, Ahmad Sabirin Zoolfakar, and Rosmalini Ab Kadir. Investigation of Stress Effect Technology on Electrical Characteristics of 90nm CMOS Devices / Hanim Hussin, Ahmad Sabirin Zoolfakar and Rosmalini Ab Kadir. 2011.
MLA (9th ed.) CitationHussin, Hanim, et al. Investigation of Stress Effect Technology on Electrical Characteristics of 90nm CMOS Devices / Hanim Hussin, Ahmad Sabirin Zoolfakar and Rosmalini Ab Kadir. 2011.
Warning: These citations may not always be 100% accurate.