APA (7th ed.) Citation

Mohammad Hanafi, M. A. (2017). Particle contamination detection in plasma etching process using Artificial Neural Network.

Chicago Style (17th ed.) Citation

Mohammad Hanafi, Muhammad Aqil. Particle Contamination Detection in Plasma Etching Process Using Artificial Neural Network. 2017.

MLA (9th ed.) Citation

Mohammad Hanafi, Muhammad Aqil. Particle Contamination Detection in Plasma Etching Process Using Artificial Neural Network. 2017.

Warning: These citations may not always be 100% accurate.