Design built-in self-test for control sequencer circuit using xilinx
An alternative to applying test vectors from an external tester is a built-in selftest (BIST). The development of BIST based on determined test pattern generation (random pattern generation) using LFSR. BIST strategies use pseudo-random sequences as the test sequences. In part of the design process...
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| Format: | Student Project |
| Language: | en |
| Published: |
2004
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| Online Access: | https://ir.uitm.edu.my/id/eprint/121734/1/121734.pdf https://ir.uitm.edu.my/id/eprint/121734/ |
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