Reduction of defects on microstructure aluminium nitride using high temperature annealing heat treatment
Aluminium Nitride (AlN) is a ceramic 111-nitride material that is used widely as components in functional devices. Besides good thermal conductivity, it also has a high band gap in emitting light which is 6 eV. AlN thin film is grown on the sapphire substrate (0001). However, lattice mismatch bet...
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Proceeding Paper |
| Language: | en en |
| Published: |
Institute of Physics Publishing
2018
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/65199/1/65199_Reduction%20of%20Defects%20on%20Microstructure%20Aluminium_conference%20article.pdf http://irep.iium.edu.my/65199/2/65199_Reduction%20of%20Defects%20on%20Microstructure%20Aluminium_scopus.pdf http://irep.iium.edu.my/65199/ http://iopscience.iop.org/article/10.1088/1757-899X/328/1/012019/pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Internet
http://irep.iium.edu.my/65199/1/65199_Reduction%20of%20Defects%20on%20Microstructure%20Aluminium_conference%20article.pdfhttp://irep.iium.edu.my/65199/2/65199_Reduction%20of%20Defects%20on%20Microstructure%20Aluminium_scopus.pdf
http://irep.iium.edu.my/65199/
http://iopscience.iop.org/article/10.1088/1757-899X/328/1/012019/pdf
