Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan
Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional...
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| Main Authors: | , , |
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| Format: | Proceeding Paper |
| Language: | en en |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf http://irep.iium.edu.my/40562/4/40562.pdf http://irep.iium.edu.my/40562/ http://iieom.org/ieom2014/index.html |
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