ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR PROCESSORS
In the processor manufacturing industry, the current methodology adopted to test and debug processors is by configuring them in the test mode with the use of on-chip or off-chip testers. The tester applies a series of test stimuli and compares the responses from the processor with the predetermin...
Saved in:
Main Author: | |
---|---|
Format: | Thesis |
Language: | English |
Published: |
2015
|
Subjects: | |
Online Access: | http://utpedia.utp.edu.my/id/eprint/21226/1/2014-ELECTRIC-ON-BOARD%20FUNCTIONAL%20TEST%20AND%20DEBUG%20PLATFORM%20FOR%20PROCESSORS-GHAZANFAR%20ALI.pdf http://utpedia.utp.edu.my/id/eprint/21226/ |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
oai:utpedia.utp.edu.my:21226 |
---|---|
record_format |
eprints |
spelling |
oai:utpedia.utp.edu.my:212262024-07-24T03:53:09Z http://utpedia.utp.edu.my/id/eprint/21226/ ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR PROCESSORS ALI, GHAZANFAR TK Electrical engineering. Electronics Nuclear engineering In the processor manufacturing industry, the current methodology adopted to test and debug processors is by configuring them in the test mode with the use of on-chip or off-chip testers. The tester applies a series of test stimuli and compares the responses from the processor with the predetermined responses to test or debug the processor. Due to the sequential and unconditional nature of the application of the series of these pre-determined test stimuli, the tester cannot be used for functional tests during the diagnosis. Hence, some faults that crop up only at-speed in the functional mode may not manifest during the diagnosis which is a critical problem in today's nano-scale manufacturing industry. To solve this issue, a test platform to carry out on-chip at-speed test and debug for embedded processor cores without using expensive external automatic test equipment (ATE) is proposed in this thesis. The proposed on-chip platform has the capability to test and debug the circuit under test (CUT) in both functional and test mode of operation. 2015-05 Thesis NonPeerReviewed application/pdf en http://utpedia.utp.edu.my/id/eprint/21226/1/2014-ELECTRIC-ON-BOARD%20FUNCTIONAL%20TEST%20AND%20DEBUG%20PLATFORM%20FOR%20PROCESSORS-GHAZANFAR%20ALI.pdf ALI, GHAZANFAR (2015) ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR PROCESSORS. Masters thesis, Universiti Teknologi PETRONAS. |
institution |
Universiti Teknologi Petronas |
building |
UTP Resource Centre |
collection |
Institutional Repository |
continent |
Asia |
country |
Malaysia |
content_provider |
Universiti Teknologi Petronas |
content_source |
UTP Electronic and Digitized Intellectual Asset |
url_provider |
http://utpedia.utp.edu.my/ |
language |
English |
topic |
TK Electrical engineering. Electronics Nuclear engineering |
spellingShingle |
TK Electrical engineering. Electronics Nuclear engineering ALI, GHAZANFAR ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR PROCESSORS |
description |
In the processor manufacturing industry, the current methodology adopted to test
and debug processors is by configuring them in the test mode with the use of on-chip
or off-chip testers. The tester applies a series of test stimuli and compares the
responses from the processor with the predetermined responses to test or debug the
processor. Due to the sequential and unconditional nature of the application of the
series of these pre-determined test stimuli, the tester cannot be used for functional
tests during the diagnosis. Hence, some faults that crop up only at-speed in the
functional mode may not manifest during the diagnosis which is a critical problem in
today's nano-scale manufacturing industry. To solve this issue, a test platform to carry
out on-chip at-speed test and debug for embedded processor cores without using
expensive external automatic test equipment (ATE) is proposed in this thesis. The
proposed on-chip platform has the capability to test and debug the circuit under test
(CUT) in both functional and test mode of operation. |
format |
Thesis |
author |
ALI, GHAZANFAR |
author_facet |
ALI, GHAZANFAR |
author_sort |
ALI, GHAZANFAR |
title |
ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR
PROCESSORS |
title_short |
ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR
PROCESSORS |
title_full |
ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR
PROCESSORS |
title_fullStr |
ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR
PROCESSORS |
title_full_unstemmed |
ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR
PROCESSORS |
title_sort |
on-board functional test and debug platform for
processors |
publishDate |
2015 |
url |
http://utpedia.utp.edu.my/id/eprint/21226/1/2014-ELECTRIC-ON-BOARD%20FUNCTIONAL%20TEST%20AND%20DEBUG%20PLATFORM%20FOR%20PROCESSORS-GHAZANFAR%20ALI.pdf http://utpedia.utp.edu.my/id/eprint/21226/ |
_version_ |
1805891022075461632 |
score |
13.222552 |