NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
The IEEE 1500 standard wrapper requires that its inputs and outputs be interfaced directly to the chip's primary inputs and outputs for controllability and observability. This is typically achieved by providing a dedicated Test Access Mechanism (TAM) between the wrapper and the primary inputs a...
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Main Authors: | Hussin, Fawnizu Azmadi, Yoneda, Tomokazu, Fujiwara, Hideo |
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Format: | Article |
Published: |
Institute of Electronics, Information and Communication Engineers, Japan (IEICE)
2008
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Subjects: | |
Online Access: | http://eprints.utp.edu.my/3595/1/fawnizu_ieice3-revised.pdf http://www.ieice.org/eng/books/trans.html http://eprints.utp.edu.my/3595/ |
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