Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations

There is a great need to design experimental setup to deal with the fundamental material issues in MEMS. Cantilever being the active part of MEMS is modeled using COMSOL Multiphysics. The model is simulated for small cracks ranging from Nano to Micro-meter. The cracks are produced at the anchor of M...

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Main Authors: Jan, M.T., Hamid, N.H.B., Md Khir, M.H.B., Shoaib, M., Mirza, A.
Format: Conference or Workshop Item
Published: IEEE Computer Society 2014
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906346410&doi=10.1109%2fICIAS.2014.6869508&partnerID=40&md5=ba257435d2bba46d4a2f19be29c03047
http://eprints.utp.edu.my/32114/
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spelling my.utp.eprints.321142022-03-29T04:34:52Z Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations Jan, M.T. Hamid, N.H.B. Md Khir, M.H.B. Shoaib, M. Mirza, A. There is a great need to design experimental setup to deal with the fundamental material issues in MEMS. Cantilever being the active part of MEMS is modeled using COMSOL Multiphysics. The model is simulated for small cracks ranging from Nano to Micro-meter. The cracks are produced at the anchor of MEMS device subjected to variations in Eigen frequencies, Stress levels and Tip displacements of cantilever beam and is measured in association with crack growths. These factors are simulated in order to predict the ultimate lifetime in the form of total number of cycles to failure in association with variations in applied stress levels and with the help of Statistical distribution and Paris's law. The Paris's law is utilized by integrating it between the upper and lower limits (crack sizes) that results in predicting the useful lifetime of the cantilever based MEMS device. The simulated results show that at resonance frequency the probability of crack growth is less due to its stress-less and free vibration. The tip displacement of the cantilever also contributes in deterioration in resonance frequency. Moreover, periodically increase in applied stresses result in rapid crack growth. © 2014 IEEE. IEEE Computer Society 2014 Conference or Workshop Item NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906346410&doi=10.1109%2fICIAS.2014.6869508&partnerID=40&md5=ba257435d2bba46d4a2f19be29c03047 Jan, M.T. and Hamid, N.H.B. and Md Khir, M.H.B. and Shoaib, M. and Mirza, A. (2014) Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations. In: UNSPECIFIED. http://eprints.utp.edu.my/32114/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description There is a great need to design experimental setup to deal with the fundamental material issues in MEMS. Cantilever being the active part of MEMS is modeled using COMSOL Multiphysics. The model is simulated for small cracks ranging from Nano to Micro-meter. The cracks are produced at the anchor of MEMS device subjected to variations in Eigen frequencies, Stress levels and Tip displacements of cantilever beam and is measured in association with crack growths. These factors are simulated in order to predict the ultimate lifetime in the form of total number of cycles to failure in association with variations in applied stress levels and with the help of Statistical distribution and Paris's law. The Paris's law is utilized by integrating it between the upper and lower limits (crack sizes) that results in predicting the useful lifetime of the cantilever based MEMS device. The simulated results show that at resonance frequency the probability of crack growth is less due to its stress-less and free vibration. The tip displacement of the cantilever also contributes in deterioration in resonance frequency. Moreover, periodically increase in applied stresses result in rapid crack growth. © 2014 IEEE.
format Conference or Workshop Item
author Jan, M.T.
Hamid, N.H.B.
Md Khir, M.H.B.
Shoaib, M.
Mirza, A.
spellingShingle Jan, M.T.
Hamid, N.H.B.
Md Khir, M.H.B.
Shoaib, M.
Mirza, A.
Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
author_facet Jan, M.T.
Hamid, N.H.B.
Md Khir, M.H.B.
Shoaib, M.
Mirza, A.
author_sort Jan, M.T.
title Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
title_short Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
title_full Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
title_fullStr Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
title_full_unstemmed Influence of crack growths on the performances of cantilever based MEMS devices: Design and simulations
title_sort influence of crack growths on the performances of cantilever based mems devices: design and simulations
publisher IEEE Computer Society
publishDate 2014
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906346410&doi=10.1109%2fICIAS.2014.6869508&partnerID=40&md5=ba257435d2bba46d4a2f19be29c03047
http://eprints.utp.edu.my/32114/
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