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Resistive open faults detectability analysis and implications for testing low power nanometric ICs

Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing wi...

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Main Authors: Mohammadat, M.T., Ali, N.B.Z., Hussin, F.A., Zwolinski, M.
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2015
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85028167359&doi=10.1109%2fTVLSI.2014.2312357&partnerID=40&md5=4223a475ce8fe75f1283bb08f2e1cb4b
http://eprints.utp.edu.my/25997/
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spelling my.utp.eprints.259972021-08-30T08:49:29Z Resistive open faults detectability analysis and implications for testing low power nanometric ICs Mohammadat, M.T. Ali, N.B.Z. Hussin, F.A. Zwolinski, M. Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing will suffice for low power nanometric designs. Our analysis shows multi-VDD tests could be required, depending on the test speed. This knowledge can be exploited in small delay fault testing to reduce the chances of test escapes while minimizing cost. © 1993-2012 IEEE. Institute of Electrical and Electronics Engineers Inc. 2015 Article NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-85028167359&doi=10.1109%2fTVLSI.2014.2312357&partnerID=40&md5=4223a475ce8fe75f1283bb08f2e1cb4b Mohammadat, M.T. and Ali, N.B.Z. and Hussin, F.A. and Zwolinski, M. (2015) Resistive open faults detectability analysis and implications for testing low power nanometric ICs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23 (3). pp. 580-583. http://eprints.utp.edu.my/25997/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing will suffice for low power nanometric designs. Our analysis shows multi-VDD tests could be required, depending on the test speed. This knowledge can be exploited in small delay fault testing to reduce the chances of test escapes while minimizing cost. © 1993-2012 IEEE.
format Article
author Mohammadat, M.T.
Ali, N.B.Z.
Hussin, F.A.
Zwolinski, M.
spellingShingle Mohammadat, M.T.
Ali, N.B.Z.
Hussin, F.A.
Zwolinski, M.
Resistive open faults detectability analysis and implications for testing low power nanometric ICs
author_facet Mohammadat, M.T.
Ali, N.B.Z.
Hussin, F.A.
Zwolinski, M.
author_sort Mohammadat, M.T.
title Resistive open faults detectability analysis and implications for testing low power nanometric ICs
title_short Resistive open faults detectability analysis and implications for testing low power nanometric ICs
title_full Resistive open faults detectability analysis and implications for testing low power nanometric ICs
title_fullStr Resistive open faults detectability analysis and implications for testing low power nanometric ICs
title_full_unstemmed Resistive open faults detectability analysis and implications for testing low power nanometric ICs
title_sort resistive open faults detectability analysis and implications for testing low power nanometric ics
publisher Institute of Electrical and Electronics Engineers Inc.
publishDate 2015
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-85028167359&doi=10.1109%2fTVLSI.2014.2312357&partnerID=40&md5=4223a475ce8fe75f1283bb08f2e1cb4b
http://eprints.utp.edu.my/25997/
_version_ 1738656809268281344
score 13.211869

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