Cover Image

A Review on Key Issues and Challenges in Devices Level MEMS Testing

Saved in:
Bibliographic Details
Main Authors: Shoaib, M., Hamid, N.H., Malik, A.F., Zain Ali, N.B., Tariq Jan, M.
Format: Article
Published: Hindawi Limited 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35
http://eprints.utp.edu.my/24250/
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.utp.eprints.24250
record_format eprints
spelling my.utp.eprints.242502021-08-23T13:25:58Z A Review on Key Issues and Challenges in Devices Level MEMS Testing Shoaib, M. Hamid, N.H. Malik, A.F. Zain Ali, N.B. Tariq Jan, M. Hindawi Limited 2016 Article NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35 Shoaib, M. and Hamid, N.H. and Malik, A.F. and Zain Ali, N.B. and Tariq Jan, M. (2016) A Review on Key Issues and Challenges in Devices Level MEMS Testing. Journal of Sensors, 2016 . http://eprints.utp.edu.my/24250/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
format Article
author Shoaib, M.
Hamid, N.H.
Malik, A.F.
Zain Ali, N.B.
Tariq Jan, M.
spellingShingle Shoaib, M.
Hamid, N.H.
Malik, A.F.
Zain Ali, N.B.
Tariq Jan, M.
A Review on Key Issues and Challenges in Devices Level MEMS Testing
author_facet Shoaib, M.
Hamid, N.H.
Malik, A.F.
Zain Ali, N.B.
Tariq Jan, M.
author_sort Shoaib, M.
title A Review on Key Issues and Challenges in Devices Level MEMS Testing
title_short A Review on Key Issues and Challenges in Devices Level MEMS Testing
title_full A Review on Key Issues and Challenges in Devices Level MEMS Testing
title_fullStr A Review on Key Issues and Challenges in Devices Level MEMS Testing
title_full_unstemmed A Review on Key Issues and Challenges in Devices Level MEMS Testing
title_sort review on key issues and challenges in devices level mems testing
publisher Hindawi Limited
publishDate 2016
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35
http://eprints.utp.edu.my/24250/
_version_ 1738656585096364032
score 13.211869

Similar Items